Profile: Vivek Goyal

Electrical Engineering

Options Independent Funding Available, Potential for UROP Funding, Potential for Academic Credit Overview Particle beam microscopy techniques, such as scanning electron microscopy (SEM) and helium ion microscopy (HIM), are commonly used in the nanoscale characterization of a wide range of samples. Particle beam microscopes conventionally image samples by raster scanning a focused incident particle beam […]

Vivek Goyal

Additional Affiliations Center for Information and Systems Engineering Honors and Awards 2021 IEEE Signal Processing Society Outstanding Editorial Board Member 2019 IEEE Signal Processing Society Best Paper Award 2017-18 IEEE Signal Processing Society Distinguished Lecturer 2017 IEEE Signal Processing Society Best Paper Award 2014 IEEE International Conference on Image Processing Best Paper Award 2013 MIT […]