FIB/TEM Facility (FTF)

The Focused Ion Beam/Transmission Electron Microscopy Facility (FTF) located in B11B and B11C at the Photonics Center is a multi-user facility for materials characterization and high-resolution imaging and analysis of a variety of solid materials (non-biological) on nanoscale. The facility is supplemented by an adjacent materials preparation laboratory located in B10 with equipment for cutting, polishing, dimpling and ion milling for preparation of surfaces and cross-sections from bulk specimens for examination with TEM, FIB-SEM, EBSD, EDS.

For further details please contact:

Address: Rooms B11B, B11C, B10 8 Saint Mary’s St., Boston, MA 02215
Contact: Alexey Nikiforov,, Tel: (617) 353-9045

Measurement Tools

Instrument Make SOP Introductory Training Video Contact
Focused Ion Beam System FEI FIB_SOP_2024 FIB Introduction* Alexey Nikiforov
Transmission Electron Microscope FEI TEM_SOP_2024 TEM Introduction* Alexey Nikiforov

*NOTE: The Introductory Training Videos are password protected. To gain access and view them, please contact the FTF laboratory manager.