Alexey Nikiforov

As a FIB/TEM Facility manager, Alexey Nikiforov is responsible for ensuring functionality of a 200 keV FEI (S)TEM and FEI FIB-SEM with Oxford Instruments EDS, he provides user training and research support with (S)TEM and FIB-SEM applications.

Alexey also covers a variety of characterization equipment in PML including scanning electron and scanning probe microscopy (SEM and AFM), electron beam lithography with nanopattern generation system on Zeiss Supra 40 FESEM, laser scanning interferometry (Zygo NewView 9000) for surface topography mapping of reflecting materials and Agilent CARY5000 UV-VIS spectrophotometer for transmittance measurements.