Two publications accepted to the 2012 ACC
Two papers by the Andersson group have been accepted for publication at the 2012 American Controls Conference, in Montreal. The first, titled “Fast detection based on semi-transient signals in AFM” is by Peng Huang and Sean B. Andersson and discusses a method to measure the width of narrow samples when scanning them using the Andersson lab’s local-raster scan algorithm.
The second, titled “Non-raster sampling in atomic force microscopy: a compressive sensing approach”, by Sean B. Andersson and Lucy Y. Pao (of the University of Colorado at Boulder) describes a new idea for reducing the number of samples needed to produce an image using AFM.
Congratulations!