Two new conference publications accepted
Two papers from the Andersson group have recently been accepted to appear at the 2011 IEEE Conference on Decision and Control in Orlando, Fl. The papers are “Probabilistic bounds for complete scanning in non-raster atomic force microscopy” by Peter Chang and Sean B. Andersson and “Three-dimensional tracking of fluorescent nanoparticles in a confocal microscope” by Zhalong Shen and Sean B. Andersson. Congratulations to all!