At the present time cost of testing is much higher than cost of design and manufacturing for computer systems. The course will contain a unified presentation of approaches for testing and diagnosis of computer hardware. Gate-level testing, functional testing, testing and diagnosis of microprocessors, memory testing, and random testing. Design for testability. Data compression of test responses. Architectures for built-in self-testing and self-diagnosis. Self-error-detection and self-error-correction in processors and memories.