Electrical Engineering

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Independent Funding Available, Potential for UROP Funding, Potential for Academic Credit

Overview

Particle beam microscopy techniques, such as scanning electron microscopy (SEM) and helium ion microscopy (HIM), are commonly used in the nanoscale characterization of a wide range of samples. Particle beam microscopes conventionally image samples by raster scanning a focused incident particle beam on the sample and integrating the intensity of secondary electrons (SEs) excited by the incident beam. Conventional microscopy is afflicted by shot noise in the incident particle beam, which limits the achievable resolution. In previous work, we had introduced time resolved measurement, where the estimation of sample pixel brightness is improved by mitigating source shot noise.

In this project, students will analyze the image resolution enhancement achievable by time resolved methods for different types of samples. Both real and Fourier domain methods will be used for calculating resolution. Students will also analyze the reduction in incident particle dose required to achieve a desired resolution. This work will inform the choice of sample in ongoing experiments to demonstrate the advantages of time resolved techniques. This work has applications in all domains of nanoscale imaging especially beam sensitive biological samples such as cells and viruses.

This project will require a time commitment between 5-10 hr/week. Familiarity with the basics of Fourier transforms and experience with coding are required. Experience with MATLAB would be preferred.

Interested students should direct inquiries to Akshay Agarwal at akshayag@bu.edu.

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