Zeiss Supra 55-VP high vacuum field-emission scanning electron microscope (FE-SEM)

Zeiss Supra 55-VP is a scanning electron microscope (SEM) with a field-emission electron gun (FEG). The SUPRA 55-VP is a versatile SEM to image and characterize samples with a wide range of conductivity, and sizes down to nanometer scales. It features a load-lock system to exchange specimens without a need to vent the main chamber and is equipped with Energy Dispersive Spectroscopy (EDS) for compositional analysis of solid samples, as well as an Everhart-Thorney (ET) secondary electron (SE) and in-lens detectors.