{"id":1551,"date":"2013-04-10T15:32:05","date_gmt":"2013-04-10T19:32:05","guid":{"rendered":"https:\/\/www.bu.edu\/photonics\/?page_id=1551"},"modified":"2025-02-25T08:25:08","modified_gmt":"2025-02-25T13:25:08","slug":"fibtem-facility-ftf","status":"publish","type":"page","link":"https:\/\/www.bu.edu\/photonics\/sharedfacilities\/fibtem-facility-ftf\/","title":{"rendered":"FIB\/TEM Facility (FTF)"},"content":{"rendered":"

\"\" <\/span>The Focused Ion Beam\/Transmission Electron Microscopy Facility (FTF)\u00a0located in B11B and B11C at the Photonics Center\u00a0is a multi-user facility for materials characterization and high-resolution imaging and analysis of a variety of solid materials (non-biological) on nanoscale.\u00a0The facility\u00a0is supplemented by an adjacent materials preparation laboratory located in B10\u00a0with equipment for cutting, polishing, dimpling and ion milling for preparation of surfaces and cross-sections from bulk specimens for examination with TEM, FIB-SEM, EBSD, EDS.<\/p>\n

For further details please contact:<\/p>\n

Address:<\/strong> Rooms B11B, B11C, B10 8 Saint Mary’s St., Boston, MA 02215
\nContact:<\/strong> Alexey Nikiforov, alnik@bu.edu<\/a>, Tel: (617) 353-9045<\/p>\n

\n\n\n\n\n\n\n
\n

Measurement Tools<\/h4>\n<\/td>\n<\/tr>\n

Instrument<\/th>\nMake<\/th>\nSOP<\/th>\nIntroductory Training Video<\/th>\nContact<\/th>\n<\/tr>\n
Focused Ion Beam System<\/td>\nFEI<\/a><\/td>\nFIB_SOP_2024<\/a><\/td>\nFIB Introduction<\/a>*<\/td>\nAlexey Nikiforov<\/td>\n<\/tr>\n
Transmission Electron Microscope<\/td>\nFEI<\/a><\/td>\nTEM_SOP_2024<\/a><\/td>\nTEM Introduction<\/a>*<\/td>\nAlexey Nikiforov<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n

*NOTE: The Introductory Training Videos are password protected. To gain access and view them, please contact the FTF laboratory manager.<\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

The Focused Ion Beam\/Transmission Electron Microscopy Facility (FTF)\u00a0located in B11B and B11C at the Photonics Center\u00a0is a multi-user facility for materials characterization and high-resolution imaging and analysis of a variety of solid materials (non-biological) on nanoscale.\u00a0The facility\u00a0is supplemented by an adjacent materials preparation laboratory located in B10\u00a0with equipment for cutting, polishing, dimpling and ion milling […]<\/p>\n","protected":false},"author":4998,"featured_media":0,"parent":96,"menu_order":7,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/pages\/1551"}],"collection":[{"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/users\/4998"}],"replies":[{"embeddable":true,"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/comments?post=1551"}],"version-history":[{"count":50,"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/pages\/1551\/revisions"}],"predecessor-version":[{"id":12519,"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/pages\/1551\/revisions\/12519"}],"up":[{"embeddable":true,"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/pages\/96"}],"wp:attachment":[{"href":"https:\/\/www.bu.edu\/photonics\/wp-json\/wp\/v2\/media?parent=1551"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}