Extended Depth of Field Scanned Imaging Over Wide Fields for Pathology

PI: Thomas Bifano

In this project, we employ a low cost scanning wide field microscope with ~8 mm x 8 mm field of view, in which aberrations in the objective lens and imaging path are compensated by adaptive optics. At the same time, the deformable mirror compensating aberrations can produce a rapid axial scan, delivering thirty times the normal depth of field for a microscope of this numerical aperture. The so-called Adaptive Extended Depth of Field Scanning Microscope is a tool that can be used to scan rapidly over large volumes of tissue at micrometer-scale resolution, and will have uses in cancer screening, pathology, and biomedicine.