ECE DLS Speaker Krishnendu Chakrabarty

  • Starts: 4:00 pm on Monday, November 20, 2017
  • Ends: 5:00 pm on Monday, November 20, 2017
ECE Distinguished Lecturer Krishnendu Chakrabarty Chair, Department of Electrical and Computer Engineering William H. Younger Distinguished Professor Duke University  Light refreshments will be available outside of PHO 339 at 3:45 pm. Title: The Hype, Myths, and Realities of Testing 2.5D/3D Integrated Circuits Abstract Despite the numerous benefits offered by 2.5D/3D integration, testing remains a major obstacle that hinders its widespread adoption. Concerns related to test cost, yield and reliability continue to derail the commercial exploitation of 2.5D/3D ICs. Test techniques and design-for-testability (DfT) solutions are now being explored in the research community, with considerable focus on wafer probing, pre-bond test of passive interposers, test access to modules in stacked dies, cost modeling, and the targeting of new defect types. In this talk, the speaker will examine the hype, myths, and realities of 2.5D/3D ICs. He will reflect on some of the over-hyped claims and describe some of the myths that have been exposed in recent years. He will present a reality-check on testing and DfT challenges, and describe some of the recent solutions being advocated for these challenges. The key questions to be addressed are: “What to Test? How to Test? When to Test?” To answer these questions, the presentation will cover pre-bond testing of TSVs and interposers, DfT solutions and optimization for stack testing, and test-flow selection. The speaker will also describe recent efforts at understanding defects and test challenges in monolithic 3D integrated circuits. Bio Krishnendu Chakrabarty received the B. Tech. degree from the Indian Institute of Technology, Kharagpur, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively. He was Assistant Professor of Electrical and Computer Engineering at Boston University during 1995-1998. He is now the William H. Younger Distinguished Professor and Chair in the Department of Electrical and Computer Engineering and Professor of Computer Science at Duke University. Prof. Chakrabarty is a recipient of the National Science Foundation CAREER award (1999), the Office of Naval Research Young Investigator award (2001), the Humboldt Research Award (2013), the IEEE Transactions on CAD Donald O. Pederson Best Paper Award (2015), the ACM Transactions on Design Automation of Electronic Systems Best Paper Award (2017) and over a dozen best paper awards at major IEEE conferences. He is also a recipient of the IEEE Computer Society Technical Achievement Award (2015) and the IEEE Circuits and Systems Society Charles A. Desoer Technical Achievement Award (2017).   Prof. Chakrabarty’s current research projects include: design-for-testability of integrated circuits and systems; microfluidic biochips; data analytics for fault diagnosis, failure prediction, and hardware security. He is a Fellow of ACM, a Fellow of IEEE, and a Golden Core Member of the IEEE Computer Society. Prof. Chakrabarty served as the Editor-in-Chief of IEEE Design & Test of Computers during 2010-2012 and ACM Journal on Emerging Technologies in Computing Systems during 2010-2015. Currently he serves as the Editor-in-Chief of IEEE Transactions on VLSI Systems. 
Location:
8 Saint Mary’s Street, room 339 at 4 pm
Registration:
http://www.bu.edu/eng/files/2017/09/ChakrabartyFlyer.Sept27LowerRes-01.jpg

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