Traditionally, three types of textures have been identified: random, fiber, and epitaxy. Each contributes particular electrical, magnetic, and mechanical qualities to the materials it comprises.

Ahmet Özcan (GRS’03), a research associate working with Physics Professor Karl Ludwig and associates at IBM, has uncovered a new kind of texture, which has been dubbed “axiotaxy.” The new texture was observed in silicides, materials used as contacts between metals and semiconductors in integrated circuits, the technology basic to modern computing and communication. The researchers used a technique called X-ray diffraction, which reveals the polycrystal structure as a circular pattern called a pole figure. Rather than the concentric circles or well-defined spots characteristic of traditional textures, they observed a complex pattern of lines and spots similar to what might be seen in a kaleidoscope.

According to Özcan, while observing a new texture type is in itself a valuable contribution to the field of materials science, understanding the unique mechanisms that cause this new type of texture is equally important and will help illuminate the physics of thin film growth and transformation. A clear understanding of the underlying structure of polycrystalline materials and how they change over time is vital to meet the continuing demand for miniaturization of computers, cell phones, and other silicon-based devices.