ME Department Seminar: William King, University of Illinois at Urbana-Champaign

Nanometer-Scale Thermal Processing by Atomic Force Microscopy: This talk describes research on nano-fabrication and nano-metrology using heated nanoprobe tips. When the heated tip of an atomic force microscope (AFM) cantilever is in contact with a substrate, the interfacial contact is a nanometer-scale hotspot that can be controlled over a wide temperature range. The tip can be used to deposit materials from the tip to the substrate, remove materials from the substrate, or induce chemical or physical reactions on the substrate. This talk describes fundamental investigations into nanometer-scale thermal transport and materials properties, applications in nanofabrication and nanometrology, and innovations in cantilever probe technology including cantilever arrays.

Date: Friday, March 15th 2013

Start Time: 11:00am

Location: RM 245


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