Computational Model for Numerical Aperture Increasing Lens Microscopy
With Xudong Chen
Associate Professor
Department of Electrical and Computer Engineering
National University of Singapore
Student Host: Reza Banaee
Refreshments will be served outside Room 339 at 11:15 a.m.
Abstract: This talk presents a computational model for modeling a numerical aperture increasing lens (NAIL) microscopy, which is also referred to as the aplanatic solid immersion lens (ASIL) microscope. The microscopic image is generated through three steps, (1) focusing of incident light on the object region; (2) interaction of the focused incident light with the object structure; and (3) sensing (or recording) the light scattered by the object structure. For NAIL microscope, only the first step, focusing of incident light through NAIL, was theoretically investigated in detail. However, the remaining two steps also greatly influence the resolution and the image quality of the microscope. The computational model presented in this talk consists of all aforementioned three steps. In particular, the vector point-spread-function, also known as the dyadic Green’s function, plays an important role in the image generation. The proposed model allows the study and analysis of both theoretical aspects like achievable resolution and practical aspects like expected images for different object patterns and experimental setups. Further, due to its computational efficiency, diverse large scale structures can be easily simulated in scanning microscope and good experimental approaches determined before indulging into the time consuming and costly process of experimentation.
About the Speaker: Dr. Xudong Chen received the B.S. and M.S. degrees in electrical engineering from Zhejiang University, China, in 1999 and 2001, respectively, and the Ph.D. degree from the Massachusetts Institute of Technology, in 2005. Since then, he joined the Department of Electrical and Computer Engineering, National University of Singapore, and he is currently an Associate Professor. His research interests are mainly electromagnetic inverse scattering problems and related imaging problems. In recent years, he has been applying his numerical and inversion techniques to tackle real world imaging problems. He has published more than 80 journal papers on inverse-scattering problems, optical microscopy, and material parameter retrieval. He visited the University of Paris-SUD 11 in May-June 2010 as an invited visiting associate professor. He was the recipient of the Young Scientist Award by the Union Radio-Scientifique Internationale (URSI) in 2010. He is presently taking sabbatical leave at Stanford University, where he works on microwave impedance tomography. |
