News
Seminar Series
December 4, 2009 Friday, 3:00PM |
Dr. Clemens Heske Using Soft x-rays to Look Into Interfaces of Energy Conversion Devices |
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The electronic and chemical structure of interfaces is of central importance for understanding and tailoring of materials, chemical processes, and electronic devices. Thus, over the past few decades, significant experimental (and theoretical) insights into electronic and chemical structures of well-defined model surfaces have been gained by a variety of approaches, and properties of interfaces have been inferred. But what if the interface (e.g., a contact to a semiconductor device), is not only buried, but also non-ideal? What if intermixing processes take place, impurities are localized, preferential bonding exists, etc.? The purpose of this talk is to demonstrate how a tool chest of soft x-ray spectroscopies (including lab-based techniques and approaches using high-brilliance synchrotron radiation) is uniquely suited to address such questions. In the talk, I will discuss a variety of applications for compound semiconductors (light-emitting devices, thin film solar cells, and devices for photoelectrochemical water splitting), and it will be shown how soft x-rays can be utilized to shed light on the electronic and chemical properties of the surfaces and interfaces involved. Biography: |
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Abstract: