Duke ECE Chair Visits BU as Part of the ECE Distinguished Speaker Series

in ECE - Mobile/Cloud Computing and Cybersecurity, ECE Spotlight Faculty, ECE Spotlight-Research, NEWS

Professor Krishnendu Chakrabarty delivers a Distinguished Lecture 

By Shereen Abubakr (QST ’18)

ece speaker series
Pictured from left to right: Professor Ayse Coskun, Duke ECE Chair Professor Krishnendu Ckakrabarty, and BU ECE Chair Professor W. Clem Karl.

Electronics such as mobile devices, biomedical chips, gaming and entertainment, and the Internet-of-Things are powered by processors, which are essentially made of integrated circuits. “Integrated circuits cause an explosion of electronics; they are the core of any device,” explains Professor Ayse Coskun.

An emerging integration technique is 2.5D/3D stacking. This involves a larger number of transistors in the chips, which are stacked in multiple layers, and leads to improved cost, performance, yield, and efficiency in electronics. The hope is for future technology to be faster, cheaper, and better. 

A big challenge, however, is how to test these complex circuits. On November 20th, Prof. Chakrabarty gave a talk on “Hype, Myths, and Realities of Testing 2.5D/3D Integrated Circuits.”

Chakrabarty’s talk explained the many benefits to using 2.5D/3D integrated circuits. However, 2.5D/3D stacking has not been widely adopted into commercial products yet, partially due to testing issues. As noted in the lecture abstract, Professor Chakrabarty reflected on “some of the over-hyped claims and described some of the myths that have been exposed in recent years.”

Professor Krishnendu Chakrabarty is the William H. Younger Distinguished Professor and serves as the Chair in the Electrical and Computer Engineering Department of Duke University. From 1995 to 1998, Prof. Chakrabarty was an Assistant Professor of Electrical and Computer Engineering at Boston University.

Prof. Chakrabarty’s current research is focused on design-for-testability of integrated circuits and systems; microfluidic biochips; and data analytics for fault diagnosis, failure prediction, and hardware security. He is also the current Editor-in-Chief of IEEE Transactions on VLSI Systems. Chakrabarty, who is highly distinguished in the areas of circuits, design automation, and testing, has received many awards for his work, including over a dozen IEEE best paper awards. Prof. Chakrabarty is a Fellow of ACM, a Fellow of the IEEE, and a Golden Core Member of the IEEE Computer Society.